Atomic Force Microscopy Scanning Tunneling Microscopy
Samuel H. Cohen, Marcia L. Lightbody
This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.
سب زمرہ:
سال:
1999
اشاعت:
1
ناشر کتب:
Springer
زبان:
english
صفحات:
219
ISBN 10:
0306462974
ISBN 13:
9780306462979
فائل:
PDF, 4.66 MB
IPFS:
,
english, 1999